Eun-jung Jang, Jaeyong Chung, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham. Post-Silicon Timing Validation Method Using Path Delay Measurements. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 232-237, IEEE Computer Society, 2011. [doi]
Abstract is missing.