Jonggyu Jang, Hyeonsu Lyu, Hyun Jong Yang, Moohyun Oh, Junhee Lee. Deep Learning-Based Autonomous Scanning Electron Microscope. In IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2020, Las Vegas, NV, USA, October 24, 2020 - January 24, 2021. pages 2886-2893, IEEE, 2020. [doi]
Abstract is missing.