Modeling and Evaluation of the Interconnection-driven Repairability for Distributed Embedded Memory Cores on Chip - researchr publication authors

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B. Jang, Nohpill Park, K. M. George, G. E. Hedrick. Modeling and Evaluation of the Interconnection-driven Repairability for Distributed Embedded Memory Cores on Chip. In M. H. Hamza, editor, Proceedings of the 22nd IASTED International Conference on Modelling, Identification, and Control (MIC 2003), February 10-13, 2003, Innsbruck, Austria. pages 403-408, IASTED/ACTA Press, 2003.

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