Marcin Janicki, Tomasz Torzewicz, Agnieszka Samson, Tomasz Raszkowski, Artur Sobczak, Mariusz Zubert, Andrzej Napieralski. Experimental investigation of discrete air cooled device thermal resistance dependence on cooling conditions. Microelectronics Reliability, 79:405-409, 2017. [doi]
Abstract is missing.