Numerical queue solution of thermal noise-induced soft errors in subthreshold CMOS devices

Pooya Jannaty, Florian C. Sabou, R. Iris Bahar, Joseph L. Mundy, William R. Patterson, Alexander Zaslavsky. Numerical queue solution of thermal noise-induced soft errors in subthreshold CMOS devices. In R. Iris Bahar, Fabrizio Lombardi, David Atienza, Erik Brunvand, editors, Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010. pages 281-286, ACM, 2010. [doi]

Abstract

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