Outlier Detection with One-Class Classifiers from ML and KDD

Jeroen H. M. Janssens, Ildikó Flesch, Eric O. Postma. Outlier Detection with One-Class Classifiers from ML and KDD. In M. Arif Wani, Mehmed M. Kantardzic, Vasile Palade, Lukasz A. Kurgan, Yuan Qi, editors, International Conference on Machine Learning and Applications, ICMLA 2009, Miami Beach, Florida, USA, December 13-15, 2009. pages 147-153, IEEE Computer Society, 2009. [doi]

Abstract

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