Kimmo Järvinen, Céline Blondeau, Dan Page, Michael Tunstall. Harnessing Biased Faults in Attacks on ECC-Based Signature Schemes. In Guido Bertoni, Benedikt Gierlichs, editors, 2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, Leuven, Belgium, September 9, 2012. pages 72-82, IEEE, 2012. [doi]
Abstract is missing.