Najmi T. Jarwala, Paul Stiling, Enn Tammaru, Chi W. Yau. A Framework for Boundary-Scan Based System Test Diagnosis. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 993-998, IEEE Computer Society, 1992.
Abstract is missing.