Thomas W. Jauch. Optimal subspace metric design for classification and regression through nonparametric cross validation objective function optimization. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, SMC 1998, Hyatt Regency La Jolla, San Diego, California, USA, October 11-14,1998. pages 3614-3622, IEEE, 1998. [doi]
Abstract is missing.