Process Capability Index Under Simultaneous Effects of Process Deterioration and Learning Process

A. Jeang, C.-P. Chung, Z. H. Wang. Process Capability Index Under Simultaneous Effects of Process Deterioration and Learning Process. In IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2020, Singapore, December 14-17, 2020. pages 1286-1290, IEEE, 2020. [doi]

Abstract

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