An Advanced BIRA for Memories With an Optimal Repair Rate and Fast Analysis Speed by Using a Branch Analyzer

Woosik Jeong, Joohwan Lee, Taewoo Han, Kaangchil Lee, Sungho Kang. An Advanced BIRA for Memories With an Optimal Repair Rate and Fast Analysis Speed by Using a Branch Analyzer. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(12):2014-2026, 2010. [doi]

Abstract

Abstract is missing.