Jawher Jerray, Bastien Sultan, Ludovic Apvrille. Fine-Grained Confidentiality and Authenticity Modeling and Verification for Embedded Systems. In 28th ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS 2025 - Companion, Grand Rapids, MI, USA, October 5-10, 2025. pages 333-344, IEEE, 2025. [doi]
Abstract is missing.