Sparse Voltage Measurement-Based Fault Location Using Intelligent Electronic Devices

Ke Jia, Bin Yang, Xiongying Dong, Tao Feng, Tianshu Bi, David W. P. Thomas. Sparse Voltage Measurement-Based Fault Location Using Intelligent Electronic Devices. IEEE Trans. Smart Grid, 11(1):48-60, 2020. [doi]

Abstract

Abstract is missing.