Xiaohong Jiang, Susumu Horiguchi, Yue Hao. Predicting the Yield Efficacy of a Defect-Tolerant Embedded Core. In 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings. pages 30, IEEE Computer Society, 2000. [doi]
Abstract is missing.