Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen. Testing of Precision DACs Using Low-Resolution ADCs with Dithering. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]
Abstract is missing.