Dong Jin, Wenzheng Li, ZhiGang Sun, Xiao Li. Fabric Defect Defection based on Lightweight Convolutional Denoising Auto-Encoder. In ICCAI '22: 8th International Conference on Computing and Artificial Intelligence, Tianjin, China, March 18 - 21, 2022. pages 478-483, ACM, 2022. [doi]
Abstract is missing.