Jionghua Jin, Jianjun Shi. Automatic feature extraction of waveform signals for in-process diagnostic performance improvement. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, SMC 1998, Hyatt Regency La Jolla, San Diego, California, USA, October 11-14,1998. pages 4716-4721, IEEE, 1998. [doi]
Abstract is missing.