Analyzing Surface Defects in Apples Using Gabor Features

Puneet Jolly, Sundaresan Raman. Analyzing Surface Defects in Apples Using Gabor Features. In Kokou YĆ©tongnon, Albert Dipanda, Richard Chbeir, Giuseppe De Pietro, Luigi Gallo, editors, 12th International Conference on Signal-Image Technology & Internet-Based Systems, SITIS 2016, Naples, Italy, November 28 - December 1, 2016. pages 178-185, IEEE Computer Society, 2016. [doi]

Abstract

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