Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Wen-Ben Jone, Patrick H. Madden. Multiple fault testing using minimal single fault test set for fanout-free circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 12(1):149-157, 1993. [doi]
Abstract is missing.