Alex K. Jones, Stephen Longofono, Sébastien Ollivier, Donald Kline Jr., Jiangwei Zhang, Rami G. Melhem. Tuning Memory Fault Tolerance on the Edge. In Yiran Chen, Victor V. Zhirnov, Avesta Sasan, Ioannis Savidis, editors, GLSVLSI '21: Great Lakes Symposium on VLSI 2021, Virtual Event, USA, June 22-25, 2021. pages 421-424, ACM, 2021. [doi]
Abstract is missing.