Statistical Estimation of Dominant Physical Parameters for Leakage Variability in 32 Nanometer CMOS, Under Supply Voltage Variations - researchr publication

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Smriti Joshi, Anne Lombardot, Philippe Flatresse, Carmelo D'agostino, Andre Juge, Edith Beigné, Stéphane Girard. Statistical Estimation of Dominant Physical Parameters for Leakage Variability in 32 Nanometer CMOS, Under Supply Voltage Variations. J. Low Power Electronics, 8(1):113-124, 2012. [doi]

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