Jorge Juan-Chico, Manuel J. Bellido, Paulino Ruiz-de-Clavijo, Carmen Baena Oliva, Manuel Valencia 0001. AUTODDM: automatic characterization tool for the delay degradation model. In Proceedings of the 2001 8th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2001, Malta, September 2-5, 2001. pages 1631-1634, IEEE, 2001. [doi]
Abstract is missing.