A 12-bit 32MS/s SAR ADC using built-in self calibration technique to minimize capacitor mismatch - researchr publication

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In-Seok Jung, Yong-Bin Kim. A 12-bit 32MS/s SAR ADC using built-in self calibration technique to minimize capacitor mismatch. In 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014. pages 276-280, IEEE, 2014. [doi]

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