VLSI: An investigation into electromagnetic signatures (EMS) for non-invasive testing and signal-integrity verification

H. J. Kadim, Lacina M. Coulibaly. VLSI: An investigation into electromagnetic signatures (EMS) for non-invasive testing and signal-integrity verification. In East-West Design & Test Symposium, EWDTS 2013, Rostov-on-Don, Russia, September 27-30, 2013. pages 1-4, IEEE, 2013. [doi]

Abstract

Abstract is missing.