Yuki Kagiyama, Shunsuke Okumura, Koji Yanagida, Shusuke Yoshimoto, Yohei Nakata, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto. Bit error rate estimation in SRAM considering temperature fluctuation. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 516-519, IEEE, 2012. [doi]
Abstract is missing.