Andrew B. Kahng, Rasit Onur Topaloglu. A DOE Set for Normalization-Based Extraction of Fill Impact on Capacitances. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 467-474, IEEE Computer Society, 2007. [doi]
Abstract is missing.