Seiji Kajihara, Kenjiro Taniguchi, Kohei Miyase, Irith Pomeranz, Sudhakar M. Reddy. Test Data Compression Using Don?t-Care Identification and Statistical Encoding. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 67, IEEE Computer Society, 2002. [doi]
Abstract is missing.