New topic session 7B: Challenges and opportunities in test and design for test (DFT) of MEMS sensors - researchr publication

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Bozena Kaminska, Bernard Courtois, Bozena Kaminska, Mary Ann Maher. New topic session 7B: Challenges and opportunities in test and design for test (DFT) of MEMS sensors. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1, IEEE, 2014. [doi]

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