Profiler: integrated statistical analysis and visualization for data quality assessment

Sean Kandel, Ravi Parikh, Andreas Paepcke, Joseph M. Hellerstein, Jeffrey Heer. Profiler: integrated statistical analysis and visualization for data quality assessment. In Genny Tortora, Stefano Levialdi, Maurizio Tucci, editors, International Working Conference on Advanced Visual Interfaces, AVI '12, Capri Island, Naples, Italy, May 22-25, 2012, Proceedings. pages 547-554, ACM, 2012. [doi]

Abstract

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