Susanne Kandl, Raimund Kirner. Error Detection Rate of MC/DC for a Case Study from the Automotive Domain. In Sang Lyul Min, Robert G. Pettit IV, Peter P. Puschner, Theo Ungerer, editors, Software Technologies for Embedded and Ubiquitous Systems - 8th IFIP WG 10.2 International Workshop, SEUS 2010, Waidhofen/Ybbs, Austria, October 13-15, 2010. Proceedings. Volume 6399 of Lecture Notes in Computer Science, pages 131-142, Springer, 2010. [doi]
Abstract is missing.