Development of a Framework for Automated Systematic Testing of Safety-Critical Embedded Systems - researchr publication authors

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Susanne Kandl, Raimund Kirner, Peter P. Puschner. Development of a Framework for Automated Systematic Testing of Safety-Critical Embedded Systems. In Wilfried Elmenreich, Gregor Novak, Ralf Seepold, editors, 4th International Workshop on Intelligent Solutions in Embedded Systems, WISES 2006, Vienna, Austria, June 30, 2006. pages 65-77, IEEE, 2006. [doi]

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