Susanne Kandl, Raimund Kirner, Peter P. Puschner. Development of a Framework for Automated Systematic Testing of Safety-Critical Embedded Systems. In Wilfried Elmenreich, Gregor Novak, Ralf Seepold, editors, 4th International Workshop on Intelligent Solutions in Embedded Systems, WISES 2006, Vienna, Austria, June 30, 2006. pages 65-77, IEEE, 2006. [doi]
@inproceedings{KandlKP06,
title = {Development of a Framework for Automated Systematic Testing of Safety-Critical Embedded Systems},
author = {Susanne Kandl and Raimund Kirner and Peter P. Puschner},
year = {2006},
doi = {10.1109/WISES.2006.329116},
url = {http://dx.doi.org/10.1109/WISES.2006.329116},
researchr = {https://researchr.org/publication/KandlKP06},
cites = {0},
citedby = {0},
pages = {65-77},
booktitle = {4th International Workshop on Intelligent Solutions in Embedded Systems, WISES 2006, Vienna, Austria, June 30, 2006},
editor = {Wilfried Elmenreich and Gregor Novak and Ralf Seepold},
publisher = {IEEE},
isbn = {3-902463-06-6},
}