Yu Kaneko, Toshio Ito, Takahiro Hara. A measurement study on virtualization overhead for applications of industrial automation systems. In 21st IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2016, Berlin, Germany, September 6-9, 2016. pages 1-8, IEEE, 2016. [doi]
@inproceedings{KanekoIH16,
title = {A measurement study on virtualization overhead for applications of industrial automation systems},
author = {Yu Kaneko and Toshio Ito and Takahiro Hara},
year = {2016},
doi = {10.1109/ETFA.2016.7733507},
url = {http://dx.doi.org/10.1109/ETFA.2016.7733507},
researchr = {https://researchr.org/publication/KanekoIH16},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {21st IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2016, Berlin, Germany, September 6-9, 2016},
publisher = {IEEE},
isbn = {978-1-5090-1314-2},
}