Dongku Kang, Minsu Kim, Suchang Jeon, Wontaeck Jung, Jooyong Park, Gyo Soo Choo, Dong-Kyo Shim, Anil Kavala, SeungBum Kim, Kyung-Min Kang, Jiyoung Lee, Kuihan Ko, Hyun Wook Park, ByungJun Min, Changyeon Yu, Sewon Yun, Nahyun Kim, Yeonwook Jung, Sungwhan Seo, Sunghoon Kim, Moo Kyung Lee, Joo-Yong Park, James C. Kim, Young San Cha, Kwangwon Kim, Youngmin Jo, Hyun-Jin Kim, Youngdon Choi, Jindo Byun, Ji-hyun Park, KiWon Kim, Tae-Hong Kwon, Young-Sun Min, Chiweon Yoon, Youngcho Kim, Dong-Hun Kwak, Eungsuk Lee, Wook-Ghee Hahn, Ki-Sung Kim, Kyungmin Kim, Euisang Yoon, Wontae Kim, Inryul Lee, SeungHyun Moon, Jeong-Don Ihm, Dae-Seok Byeon, Ki-Whan Song, Sangjoon Hwang, Kyehyun Kyung. th-Generation V-NAND Flash Memory with 82MB/s Write Throughput and 1.2Gb/s Interface. In IEEE International Solid- State Circuits Conference, ISSCC 2019, San Francisco, CA, USA, February 17-21, 2019. pages 216-218, IEEE, 2019. [doi]
@inproceedings{KangKJJPCSKKKLK19,
title = {th-Generation V-NAND Flash Memory with 82MB/s Write Throughput and 1.2Gb/s Interface},
author = {Dongku Kang and Minsu Kim and Suchang Jeon and Wontaeck Jung and Jooyong Park and Gyo Soo Choo and Dong-Kyo Shim and Anil Kavala and SeungBum Kim and Kyung-Min Kang and Jiyoung Lee and Kuihan Ko and Hyun Wook Park and ByungJun Min and Changyeon Yu and Sewon Yun and Nahyun Kim and Yeonwook Jung and Sungwhan Seo and Sunghoon Kim and Moo Kyung Lee and Joo-Yong Park and James C. Kim and Young San Cha and Kwangwon Kim and Youngmin Jo and Hyun-Jin Kim and Youngdon Choi and Jindo Byun and Ji-hyun Park and KiWon Kim and Tae-Hong Kwon and Young-Sun Min and Chiweon Yoon and Youngcho Kim and Dong-Hun Kwak and Eungsuk Lee and Wook-Ghee Hahn and Ki-Sung Kim and Kyungmin Kim and Euisang Yoon and Wontae Kim and Inryul Lee and SeungHyun Moon and Jeong-Don Ihm and Dae-Seok Byeon and Ki-Whan Song and Sangjoon Hwang and Kyehyun Kyung},
year = {2019},
doi = {10.1109/ISSCC.2019.8662493},
url = {https://doi.org/10.1109/ISSCC.2019.8662493},
researchr = {https://researchr.org/publication/KangKJJPCSKKKLK19},
cites = {0},
citedby = {0},
pages = {216-218},
booktitle = {IEEE International Solid- State Circuits Conference, ISSCC 2019, San Francisco, CA, USA, February 17-21, 2019},
publisher = {IEEE},
isbn = {978-1-5386-8531-0},
}