Process variation tolerant all-digital multiphase DLL for DDR3 interface

Heechai Kang, Kyungho Ryu, Donghwan Lee, Won Lee, SuHo Kim, JongRyun Choi, Seong-Ook Jung. Process variation tolerant all-digital multiphase DLL for DDR3 interface. In Jacqueline Snyder, Rakesh Patel, Tom Andre, editors, IEEE Custom Integrated Circuits Conference, CICC 2010, San Jose, California, USA, 19-22 September, 2010, Proceedings. pages 1-4, IEEE, 2010. [doi]

Abstract

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