Wang Kang, Liuyang Zhang, Weisheng Zhao, Jacques-Olivier Klein, Youguang Zhang, Dafine Ravelosona, Claude Chappert. Yield and Reliability Improvement Techniques for Emerging Nonvolatile STT-MRAM. IEEE J. Emerg. Sel. Topics Circuits Syst., 5(1):28-39, 2015. [doi]
Abstract is missing.