Rouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum. Noise characterization of static CMOS gates. In Sharad Malik, Limor Fix, Andrew B. Kahng, editors, Proceedings of the 41th Design Automation Conference, DAC 2004, San Diego, CA, USA, June 7-11, 2004. pages 888-893, ACM, 2004. [doi]
@inproceedings{KanjLAR04,
title = {Noise characterization of static CMOS gates},
author = {Rouwaida Kanj and Timothy Lehner and Bhavna Agrawal and Elyse Rosenbaum},
year = {2004},
doi = {10.1145/996566.996803},
url = {http://doi.acm.org/10.1145/996566.996803},
researchr = {https://researchr.org/publication/KanjLAR04},
cites = {0},
citedby = {0},
pages = {888-893},
booktitle = {Proceedings of the 41th Design Automation Conference, DAC 2004, San Diego, CA, USA, June 7-11, 2004},
editor = {Sharad Malik and Limor Fix and Andrew B. Kahng},
publisher = {ACM},
isbn = {1-58113-828-8},
}