Sachhidh Kannan, Naghmeh Karimi, Ramesh Karri, Ozgur Sinanoglu. Detection, diagnosis, and repair of faults in memristor-based memories. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-6, IEEE, 2014. [doi]
@inproceedings{KannanKKS14,
title = {Detection, diagnosis, and repair of faults in memristor-based memories},
author = {Sachhidh Kannan and Naghmeh Karimi and Ramesh Karri and Ozgur Sinanoglu},
year = {2014},
doi = {10.1109/VTS.2014.6818762},
url = {http://dx.doi.org/10.1109/VTS.2014.6818762},
researchr = {https://researchr.org/publication/KannanKKS14},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014},
publisher = {IEEE},
}