Impact of interconnect multiple-patterning variability on SRAMs - researchr publication authors

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Ioannis Karageorgos, Michele Stucchi, Praveen Raghavan, Julien Ryckaert, Zsolt Tokei, Diederik Verkest, Rogier Baert, Sushil Sakhare, Wim Dehaene. Impact of interconnect multiple-patterning variability on SRAMs. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 609-612, ACM, 2015. [doi]

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