Ioannis Karageorgos, Michele Stucchi, Praveen Raghavan, Julien Ryckaert, Zsolt Tokei, Diederik Verkest, Rogier Baert, Sushil Sakhare, Wim Dehaene. Impact of interconnect multiple-patterning variability on SRAMs. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 609-612, ACM, 2015. [doi]
@inproceedings{KarageorgosSRRT15,
title = {Impact of interconnect multiple-patterning variability on SRAMs},
author = {Ioannis Karageorgos and Michele Stucchi and Praveen Raghavan and Julien Ryckaert and Zsolt Tokei and Diederik Verkest and Rogier Baert and Sushil Sakhare and Wim Dehaene},
year = {2015},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7092460},
researchr = {https://researchr.org/publication/KarageorgosSRRT15},
cites = {0},
citedby = {0},
pages = {609-612},
booktitle = {Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015},
editor = {Wolfgang Nebel and David Atienza},
publisher = {ACM},
isbn = {978-3-9815370-4-8},
}