Parallel Testing of Multi-port Static Random Access Memories for BIST

Farzin Karimi, Fabrizio Lombardi. Parallel Testing of Multi-port Static Random Access Memories for BIST. In 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. pages 271-279, IEEE Computer Society, 2001. [doi]

Abstract

Abstract is missing.