Dimitris A. Karras, Basil G. Mertzios. Improved Defect Detection Using Novel Wavelet Feature Extraction Involving Principal Component Analysis and Neural Network Techniques. In Bob McKay, John K. Slaney, editors, AI 2002: Advances in Artificial Intelligence, 15th Australian Joint Conference on Artificial Intelligence, Canberra, Australia, December 2-6, 2002, Proceedings. Volume 2557 of Lecture Notes in Computer Science, pages 638-647, Springer, 2002. [doi]
Abstract is missing.