Sai Anirudh Karre, Y. Raghu Reddy. A Defect Dependency based Approach to Improve Software Quality in Integrated Software Products. In Joaquim Filipe, Leszek A. Maciaszek, editors, ENASE 2015 - Proceedings of the 10th International Conference on Evaluation of Novel Approaches to Software Engineering, Barcelona, Spain, 29-30 April, 2015. pages 110-117, SciTePress, 2015. [doi]
Abstract is missing.