Application of Pairwise Testing into BWDM which is a Test Case Generation Tool for the VDM++ Specification

Tetsuro Katayama, Futa Hirakoba, Yoshihiro Kita, Hisaaki Yamaba, Kentaro Aburada, Naonobu Okazaki. Application of Pairwise Testing into BWDM which is a Test Case Generation Tool for the VDM++ Specification. JRNAL, 6(3):143-147, 2019. [doi]

Authors

Tetsuro Katayama

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Futa Hirakoba

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Yoshihiro Kita

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Hisaaki Yamaba

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Kentaro Aburada

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Naonobu Okazaki

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