Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji. Time-division multiplexing for testing SoCs with DVS and multiple voltage islands. In 17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France. pages 1-6, IEEE Computer Society, 2012. [doi]
Abstract is missing.