TCI Tester: Tester for Through Chip Interface

Hideto Kayashima, Hideharu Amano. TCI Tester: Tester for Through Chip Interface. In ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, Tokyo, Japan, January 18-21, 2021. pages 103-104, ACM, 2021. [doi]

Abstract

Abstract is missing.