John Keane, Tae-Hyoung Kim, Chris H. Kim. An on-chip NBTI sensor for measuring PMOS threshold voltage degradation. In Diana Marculescu, Anand Raghunathan, Ali Keshavarzi, Vijaykrishnan Narayanan, editors, Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007, Portland, OR, USA, August 27-29, 2007. pages 189-194, ACM, 2007. [doi]
Abstract is missing.