An Array-Based Test Circuit for Fully Automated Gate Dielectric Breakdown Characterization

John Keane, S. Venkatraman, Paulo F. Butzen, Chris H. Kim. An Array-Based Test Circuit for Fully Automated Gate Dielectric Breakdown Characterization. IEEE Trans. VLSI Syst., 19(5):787-795, 2011. [doi]

Abstract

Abstract is missing.