Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test

David C. Keezer, R. J. Wenzel. Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 94-100, IEEE Computer Society, 1997.

Abstract

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