T. Kempf, Vincenzo Della Marca, L. Baron, F. Maugain, F. La Rosa, Stephan Niel, Arnaud Régnier, Jean Michel Portal, Pascal Masson. Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 6, IEEE, 2018. [doi]
Abstract is missing.